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Functional and Parametric Testing System Tester FORMULA HF3 for Integrated Circuits

Electrical Measurement Systems

Manufacturer: FORM LLC

Price: Request Quote

Bulk pricing available

FOB, CIF & EXW terms available

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Description

FORMULA HF3 tester is designed for functional and parametric control of fast VLSI of a wide range of nomenclature: microcontrollers, static and dynamic memory, VLSI on BMK, ASICs, FPGAs, etc. with the number of signal pins up to 256 and frequency of operation up to 200 MHz.

The field of application of the Testers is testing and quality control at all stages of the VLSI life cycle, including:
- testing and research of newly developed types of microcircuits
- production and acceptance tests of serial products: qualification tests,
- periodic, rejection, acceptance tests
- certification tests
- incoming inspection

Specifications

Vector memory capacity per channel

??67 108 864? pcs

Dynamic active load

Armoured glass

Comprehensive automated verification of digital microchips of large and ultra-large integration degree, including microcircuits

Armoured glass

Control and measurement of microcircuits on the wafer and in the case during the development, testing, production and operation

Armoured glass

Error memory capacity (comparator response memory) per channel

??67 108 864? pcs

Active load current

0;0005...0;025 A

Minimum pulse duration

0;0015...0;0018

Absolute error of time stamp formation

?0;0007

Measurement and reproduction of DC current strength by power supplies

?4 A

Reproduction and measurement of DC power by a static meter

?0;15 A

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Shipping Terms

FOB Novorossiysk, Russia CIF Available to major ports worldwide EXW Manufacturer's facility, Russia

Delivery Time

Sea freight: 30-60 days (depending on destination) Air freight: 14-21 days (for urgent orders)

Payment Methods

Letter of Credit (L/C) Wire Transfer (T/T) Escrow Services

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Functional and Parametric Testing System Tester FORMULA HF3 for Integrated Circuits

Description

Specifications

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