Integrated Circuit Testing Complex for Digital ICs FORMULA BiS-2K - Reliable Testing Solutions

The FORMULA BiS-2K complex is designed for testing of small and medium-sized integrated circuits, including digital ICs, including hardware logic and static RAM under conditions of regulated gas environment by ETT methods; failure tests; exposure to increased temperature of the working environment; dynamic, static functional control, as well as measurement of static parameters.
Structurally, the FORMULA BiS-2K Complex consists of a test volume rack with a test chamber, a rack of control systems, a rack of load boards and an electronics rack, which houses the FORMULA 2K Tester.
The advantages of the FORMULA BiS-2K Complex are the implementation of the TDBI (test during burning) system - testing of ICs during training - testing simultaneously with ETT due to the integration of the FORMULA 2K Tester into the Complex, as well as the possibility of testing under conditions of controlled gas environment in order to exclude oxidation of the tested products.