Device of illuminating by method "dark field" OTP
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Description
For observation of transparent objects in transmitted light using the "dark field" method. Allows to detect hidden defects (bubbles, microcracks, inhomogeneous inclusions), invisible under normal illumination.As a light source the standard illuminator of MBS microscope with 12 V/20 W halogen lamp is used. The "dark field" effect is observed at magnifications of the microscope corresponding to the indices 2; 4; 7 on the magnification change knobs.
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